T&DF System Test Group

SIU/EPU Test Procedures

An SIU/EPU is built from a SIB, LCB, RAD750, CPS, and Backplane, each of which are individually tested before being combined into an SIU/EPU.

For each new SIU/EPU, run these procedures.

SIB

1. LAT-TD-06978 SIB Qualification Test Procedure
2. LAT-TD-07382 Procedure for Burning a SIB in a cPCI Crate
3. LAT-TD-07484 Procedure for Uploading Files to SIB EEPROMs over 1553

LCB

1. LAT-TD-06939 LCB Qualification Performance Test Procedure
2. LAT-TD-03650 Conformal Coated LCB Performance Test Procedure

RAD750

1. LAT-TD-07529 Procedure for Burning PBC into RAD750 SUROM

Crate Backplane

1. LAT-TD-01667 Test Procedure, EPU/SIU Backplane Assembly

Crate Power Supply

SIU/EPU

1. LAT-TD-07194 SIU/EPU Electrical Interface Continuity and Isolation Test (EICIT)
2. LAT-TD-07195 Spacecraft Interface Unit (SIU) Stray Voltage Test (SVT)
3. LAT-TD-01686 Spacecraft Interface Unit Test Procedure (LPT/CPT)
4. LAT-TD-03648 Vibration/Acoustics Procedure, SIU
5. LAT-TD-03647 GLAST LAT SIU/EPU EMI Acceptance Test Procedure
6. LAT-TD-03649 Thermal Vacuum Procedure, SIU

Other Procedures and Documents

LAT-TD-07107 EMI Test Procedure for SIU
LAT-TD-07830 Flight Crate Procedure for Burning SIU PBC into RAD750 SUROM
LAT-TD-07831 Flight Crate Procedure for Burning EPU PBC into RAD750 SUROM
EPU PBC Burn Review
MRB

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Last modified: 02/06/2006 3:58 PM