Online telecon notes for December 4, 2002

Attending:

• Connie Houchens (GSFC/ACD)
• Sharon Orsborne (GSFC/ACD)
• Byron Leas (NRL/CAL)
• Luca Latronico (INFN Pisa/TKR)
• Luca Baldini (INFN Pisa/TKR)
• Curt Brune (SLAC/FSW)
• Mike Huffer (SLAC/ELX)
• Larry Wai (SLAC/I&T-IFCT)
• Eduardo do Couto e Silva (SLAC/I&T-SVAC)
• Selim Tuvi (SLAC/I&T-Online)
• Ric Claus (SLAC/I&T-Online), minutes author

Topics:

• Core (Selim, Ric)
• Ric:
• Online is in the throws of trying to get the release discussed last week distributed
• Now also includes message logging
• Selim:
• Expect to distribute the release in the next few days
• Currently experiencing some Hippodraw related problems
• ELX (Mike)
• Architecture 2a functional test by end of the week
• 2 to be shipped to Byron, 1 for EM1 test (Larry)

q Byron suggests staggering the two for CAL in case of updates

• On schedule for 17 test stands 2a deployed by Christmas
• Test jigs are in the process of being put together
• Progress made on GASU board
• AEM is now included in GASU board
• GASU schematics expected to be done by end of next week
• Expect layout done by Christmas
• Expect boards fabricated for loading first week of January

q Also true for prototype PDU and LCB

• GASU also contains GLT, Fan In/Fan Out, Clock distribution and EPU functional blocks
• AEM document unchanged and should still apply to GASU
• Chip containing the self trigger “fix” for the pseudo AEM has been produced, sent to ACD/ELX
• Bob Baker reports having received it
• Not useable without upcoming Online software release
• Mike: ELX has received drawings, etc. to produce new style GAFE testers
• Does the new style GAFE tester work with the existing GARC tester?

q Connie will find out

• Does ACD/I&T have software to test the new GAFE release, e.g. linearity tests, etc.

q Connie: not yet; working on same

• ACD (Sharon, Connie)
• Connie/Sharon to send a list of tests for GARC/GAFE
• Get the latest LabVIEW code from Bob Baker
• Sharon working on a qt/python based version
• Connie: Will other ACD ICD requirements driven changes to the pseudo AEM be handled in the same way as the self-trigger change was?
• Mike: Not aware of any other requirements except the ability to handle multiple FREE boards. That won’t appear until the GASU is delivered (scheduled for Spring)
• Mike: FREE board and GARC tester are not plug compatible
• Mike: Who is the consumer of the self-trigger ability: ACD/ELX or ACD/I&T?
• Sharon to find out
• Connie worked on 3 sets of tests for GARCs

§ tests return a list of results to Sharon for QT

• tests option to print results to screen and file
• test to compare results to a desire results PASS/FAIL response.
• Would like to know how to do EGUs and Constraints in the official way

q Best to wait for the impending Online release

• Sharon working on Qt screens
• CAL (Byron)
• Managed to take Muon data
• In discussion with Curt and Leonid about the “short packet problem”
• Curt may have been able to reproduce the problem at SLAC
• Testing GCRC V5
• Getting ready to send functional tests to Larry
• Asked where 3-in-a-row triggers were documented
• Taken off-line
• Mike: How does CAL currently control the bias voltages
• Crudely via external power supply tweaking
• TKR (Luca L., Luca B.)
• Luca L. about to return to Pisa
• Learned system, made plans, created threshold scan program (charge injection)
• Working with test stand 2a components
• Did noise measurement, but results look too good to be true. Luca B. to investigate with UCSC
• Will study DAQ response using asynchronous trigger (low threshold noise trigger and source)
• Want to perform a dead time measurement, but need the impending Online release
• Mike: Note that in a CAL/TKR combined system, one can’t currently separate CAL vs. TKR induced dead time
• A special charge injector is being built for TKR
• Will help high rate, TOT tests
• Need to coordinate with TKR
• Eduardo: Can test dynamic range with this?

q Mike: Under discussion. Project has some arbitrary limits due to time constraints

• Byron: Useful for CAL

q Mike: No, because CalStrobe does a good job of mimicking charge from the detector

• Working toward Run Control framework
• Ric: Is hang still seen (where software triggers just stop during a long run)
• Luca: No, haven’t really seen it again
• Code optimization leads Luca to believe that the threshold scan can be done at 1 KHz trigger rate
• Larry: This seems quite a high rate. Why the need for the special device?

q Mike: The final system will need to be able to handle 10 KHz bursts. Want to be able to test this

• Eduardo: Can do threshold scans per chip?
• Luca: can do per ladder, per strip, selectable
• Mike: plans for cross talk tests?
• Luca: coming
• Eduardo: New ASICS that fix TOT available for the EM test?
• Mike: No, production for the EM test is already done and is the previous release
• Some known work-arounds can be applied to get something out of the TOTs, but it’s not clear what the quality is or whether that’s useful
• IFCT (Larry)
• Baseline functional tests
• SVAC (Eduardo)
• See LAT-SS-00573 for the plan on what is to be done with EM data, including calibrations