· LAT-SS-00168
TRK Elec. Conceptional Design
· LAT-SS-00152
Lvl-4 Requirements
· LAT-SS-00169
Readout ASIC (GTFE) Specifications
· LAT-SS-00170
Controller ASIC (GTRC) Specifications
· LAT-SS-00171
TMCM Specifications
· LAT-SS-00173
Ground-Shielding Plan
· LAT-SS-00175
Flex Cable Specifications
· LAT-SS-00176
Electrical interface Specifications
· LAT-TD-00178
Reliability Analysis
· LAT-SS-00179
Electrical Parts List (Preliminary)
· LAT-TD-00244
TOT Requirements for the LAT TKR
· LAT-TD-00246
Readout ASIC (GTFE) Prototype Test Plan
· LAT-TD-00247
GTFE Wafer Probing Test Procedure
· LAT-TD-00248
GTRC Wafer Probing Test Procedure
· LAT-TD-00191
Tower Electrical Test plan
· LAT-TD-00153
Electronics Test Systems
· LAT-TD-00232
Noise Analysis of the LAT TRK Amplifier
· LAT-TD-00333
Radiation Test Results (Heavy Ions)
· LAT-TD-00364 Noise Occupancy in the BTEM
· NIMA457 BTEM Construction NIM A Paper
· SLAC-8549 BTEM Electronics Paper